Items where Author is "Richter, Uwe"

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Grunewald, Tobias and Wurm, Matthias and Teichert, Sven and Bodermann, Bernd and Reck, Johanna and Richter, Uwe (2020) Measurement of layer thicknesses with an improved optimization method for depolarizing Mueller matrices. Measurement Science and Technology, 31 (11). p. 115010. ISSN 0957-0233

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